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Collaboration on sensor and data acquisition

09 December 2009

Honeywell and National Instruments have collaborated on test and measurement systems that offer plug-and-play compatibility between Honeywell sensors and National Instruments data acquisition instrumentation.The collaboration makes it easier for customers to set up and configure measurement systems using Honeywell and National Instruments components.

By working together on better connectivity, expanded networking capabilities and improved measurement accuracy, the two companies are targeting the most common challenges associated with multi-vendor test and measurement systems.

"Whether customers currently use Honeywell sensor technology or National Instruments data acquisition systems, there are now more options for them to easily integrate test system components," said Phil Geraffo, VP and GM of Honeywell Sensing & Control's Test and Measurement business. "By bringing together the industry leaders in sensing and data acquisition, this collaboration helps our customers save time and money in both selecting and configuring sensors and instrumentation."

"Our collaboration with Honeywell continues the National Instruments tradition of delivering some of the most flexible test and measurement solutions available," said John Graff, vice president of marketing and customer operations at National Instruments. "By addressing engineers' practical needs for better interconnectivity, dependable networking and improved accuracy, these new tools will enhance productivity in numerous applications and we are proud to be a part of this team effort."

As part of the collaboration, the companies are working to ensure easier connectivity between National Instruments and Honeywell hardware so customers can easily connect Honeywell sensors to compatibility-tested data acquisition instrumentation from National Instruments. This improved connectivity reduces installation time by eliminating the need for custom cabling.

Another benefit of the collaboration is enhanced networking functionality, which gives engineers the flexibility to integrate sensors into a data acquisition system via wireless, Ethernet, or USB. This significantly increases test and measurement productivity, especially in cases when engineers continually reconfigure their systems. Additionally, the companies have joined forces to help engineers electronically transfer key sensor information using embedded TEDS (IEEE 1451.4) technology, which maintains data integrity and ensures accurate and reliable readings.

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